First 2017 Meeting for the X-ray Tomography Signal Integrity Project
Date: Monday, Jan 23, 2017
We should have a full meeting.
The university researchers will have developed a few slides showing how they calibrate their system.
Dr Simon and his group will have prepared cross-sections to substantiate the dimensional measurements presented.
Dr Simon and his group will have carried out some electrical measurements with a Vector Network Analyzer (VNA) to compare the S parameter results obtained by inputting the 3D x-ray measured dimensions and the materials properties into the CAD model and then into the EM Field Simulator.
There was some discussion about what to do next: go to the package level (suggested by Dr. Simon) or look at something like press fit connectors (suggested by Mike). The former may not be looked at fondly by component manufacturers as this is getting close to reverse engineering. Further discussion is required. Phase 2 of the project maybe?