High Frequency Loss from Copper Topology

The recently completed Smooth Cu Si project suggested a difference in the X versus Y axis topography of the drum side of the copper foil after some treatments could affect insertion loss. This project will delve into the question of how this copper directionality or topography can affect insertion loss and evaluate the level of this loss.

Project stage: 
Project type: 
Lead company: 
Oracle

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Idea Information

Background: 

 

 The HDPUG Smooth Cu SI project work recently completed suggests a difference in the X versus Y axis roughness on the drum or “shiny” side of the copper foil after some treatments can significantly affect insertion loss.

 

The recently observed change in rank order of treatment #E may be due to either test method or test coupon orientation.